JENTEK

Description

measurement and analysis systems comprising electromagnetic inductive and capacitive and dielectrometer sensors, probes and sensor arrays, computer hardware, impedance analyzers, and data acquisition and analysis software, designed for measuring electrical properties, such as conductivity and permeability, of materials such as metal, composites and ceramics, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of adhesives and metallic, graphite composite, ceramic, glass, paper, epoxy, and plastic parts, field inspection, namely, measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as cure states, stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, moisture content, porosity, contamination and residual protective capacity for filter materials