NSX

Description

Inspection and metrology equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor and electronic related components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of something thereon; Inspection and metrology equipment and devices, namely, equipment and devices that measure the 3D dimensions and overlay of features in semiconductor and electronic related components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media